X-ray characterization and analysis

X-ray diffraction (XRD) pattern gives valuable information about the composition and structure of the material. It is a non-destructive, non-intrusive characterization method.

XRD gives us informations about the elements present, minerals found, different phases of the minerals as well as crystallinity of the sample as well as crystal structure. It gives a great insight in studying about the microstructures of the specimen. 


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Telephone : ​631-632-9341
Email : Sherif.Abdelaziz@StonyBrook.edu